TY - GEN
T1 - The strength of R&D network ties in high-tech industries: A multi-dimensional analysis of tie strength on technological performance
AU - Hagedoorn, J.
AU - Bertrand-Cloodt, D.A.M.
AU - van Kranenburg, H.L.
N1 - proceedings of the Strategic Management Society (SMS) Conference
Washington DC, USA
PY - 2009/1/1
Y1 - 2009/1/1
M3 - Conference article in proceeding
BT - proceedings of the Strategic Management Society (SMS) Conference
CY - Washington DC, USA
T2 - Strategic Management Society (SMS) Conference
Y2 - 11 October 2009 through 14 October 2009
ER -