Sub-pixel electron detection using a convolutional neural network

J. Paul van Schayck, Eric van Genderen, Erik Maddox, Lucas Roussel, Hugo Boulanger, Erik Frojdh, Jan-Pieter Abrahams, Peter J. Peters, Raimond B. G. Ravelli*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Web of Science)
Original languageEnglish
Article number113091
Number of pages10
JournalUltramicroscopy
Volume218
DOIs
Publication statusPublished - Nov 2020

Keywords

  • Structural biology
  • Cryo-EM
  • Detectors
  • Neural network
  • CCD CAMERAS
  • RESOLUTION
  • DIFFRACTION
  • EFFICIENCY

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