Sub-pixel electron detection using a convolutional neural network

J. Paul van Schayck; Eric van Genderen; Erik Maddox; Lucas Roussel; Hugo Boulanger; Erik Frojdh; Jan-Pieter Abrahams; Peter J. Peters; Raimond B. G. Ravelli

doi:10.1016/j.ultramic.2020.113091

Sub-pixel electron detection using a convolutional neural network

J. Paul van Schayck, Eric van Genderen, Erik Maddox, Lucas Roussel, Hugo Boulanger, Erik Frojdh, Jan-Pieter Abrahams, Peter J. Peters, Raimond B. G. Ravelli^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Article number	113091
Number of pages	10
Journal	Ultramicroscopy
Volume	218
DOIs	https://doi.org/10.1016/j.ultramic.2020.113091
Publication status	Published - Nov 2020

Keywords

Structural biology
Cryo-EM
Detectors
Neural network
CCD CAMERAS
RESOLUTION
DIFFRACTION
EFFICIENCY

Access to Document

10.1016/j.ultramic.2020.113091Licence: CC BY

Cite this

@article{536996e803b94e75bf9f323442570aed,

title = "Sub-pixel electron detection using a convolutional neural network",

keywords = "Structural biology, Cryo-EM, Detectors, Neural network, CCD CAMERAS, RESOLUTION, DIFFRACTION, EFFICIENCY",

author = "{van Schayck}, {J. Paul} and {van Genderen}, Eric and Erik Maddox and Lucas Roussel and Hugo Boulanger and Erik Frojdh and Jan-Pieter Abrahams and Peters, {Peter J.} and Ravelli, {Raimond B. G.}",

year = "2020",

month = nov,

doi = "10.1016/j.ultramic.2020.113091",

language = "English",

volume = "218",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

TY - JOUR

T1 - Sub-pixel electron detection using a convolutional neural network

AU - van Schayck, J. Paul

AU - van Genderen, Eric

AU - Maddox, Erik

AU - Roussel, Lucas

AU - Boulanger, Hugo

AU - Frojdh, Erik

AU - Abrahams, Jan-Pieter

AU - Peters, Peter J.

AU - Ravelli, Raimond B. G.

PY - 2020/11

Y1 - 2020/11

KW - Structural biology

KW - Cryo-EM

KW - Detectors

KW - Neural network

KW - CCD CAMERAS

KW - RESOLUTION

KW - DIFFRACTION

KW - EFFICIENCY

U2 - 10.1016/j.ultramic.2020.113091

DO - 10.1016/j.ultramic.2020.113091

M3 - Article

C2 - 32835904

VL - 218

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

M1 - 113091

ER -