Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample

Martine van Nierop; Tineke Lataster; Feikje Smeets; Nicole Gunther; Catherine van Zelst; Ron de Graaf; Margreet ten Have; Saskia van Dorsselaer; Maarten Bak; Inez Myin-Germeys; Wolfgang Viechtbauer; Jim van Os; Ruud van Winkel

doi:10.1093/schbul/sbt150

Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample

Martine van Nierop, Tineke Lataster, Feikje Smeets, Nicole Gunther, Catherine van Zelst, Ron de Graaf, Margreet ten Have, Saskia van Dorsselaer, Maarten Bak, Inez Myin-Germeys, Wolfgang Viechtbauer, Jim van Os, Ruud van Winkel

MHeNs - Mental Health

Research output: Contribution to journal › Article › Academic › peer-review

33 Citations (Scopus)

Original language	English
Pages (from-to)	S123-S130
Journal	Schizophrenia Bulletin
Volume	40
DOIs	https://doi.org/10.1093/schbul/sbt150
Publication status	Published - Mar 2014

Keywords

epidemiology
childhood adversity
psychosis

Cite this

van Nierop, M., Lataster, T., Smeets, F., Gunther, N., van Zelst, C., de Graaf, R., ten Have, M., van Dorsselaer, S., Bak, M., Myin-Germeys, I., Viechtbauer, W., van Os, J., & van Winkel, R. (2014). Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample. Schizophrenia Bulletin, 40, S123-S130. https://doi.org/10.1093/schbul/sbt150

van Nierop, Martine ; Lataster, Tineke ; Smeets, Feikje ; Gunther, Nicole ; van Zelst, Catherine ; de Graaf, Ron ; ten Have, Margreet ; van Dorsselaer, Saskia ; Bak, Maarten ; Myin-Germeys, Inez ; Viechtbauer, Wolfgang ; van Os, Jim ; van Winkel, Ruud. / Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample. In: Schizophrenia Bulletin. 2014 ; Vol. 40. pp. S123-S130.

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title = "Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample",

keywords = "epidemiology, childhood adversity, psychosis",

author = "{van Nierop}, Martine and Tineke Lataster and Feikje Smeets and Nicole Gunther and {van Zelst}, Catherine and {de Graaf}, Ron and {ten Have}, Margreet and {van Dorsselaer}, Saskia and Maarten Bak and Inez Myin-Germeys and Wolfgang Viechtbauer and {van Os}, Jim and {van Winkel}, Ruud",

year = "2014",

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doi = "10.1093/schbul/sbt150",

language = "English",

volume = "40",

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van Nierop, M, Lataster, T, Smeets, F, Gunther, N, van Zelst, C, de Graaf, R, ten Have, M, van Dorsselaer, S, Bak, M, Myin-Germeys, I, Viechtbauer, W, van Os, J & van Winkel, R 2014, 'Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample', Schizophrenia Bulletin, vol. 40, pp. S123-S130. https://doi.org/10.1093/schbul/sbt150

Psychopathological Mechanisms Linking Childhood Traumatic Experiences to Risk of Psychotic Symptoms: Analysis of a Large, Representative Population-Based Sample. / van Nierop, Martine; Lataster, Tineke; Smeets, Feikje; Gunther, Nicole; van Zelst, Catherine; de Graaf, Ron; ten Have, Margreet; van Dorsselaer, Saskia; Bak, Maarten; Myin-Germeys, Inez; Viechtbauer, Wolfgang; van Os, Jim; van Winkel, Ruud.

In: Schizophrenia Bulletin, Vol. 40, 03.2014, p. S123-S130.

Research output: Contribution to journal › Article › Academic › peer-review

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AU - van Nierop, Martine

AU - Lataster, Tineke

AU - Smeets, Feikje

AU - Gunther, Nicole

AU - van Zelst, Catherine

AU - de Graaf, Ron

AU - ten Have, Margreet

AU - van Dorsselaer, Saskia

AU - Bak, Maarten

AU - Myin-Germeys, Inez

AU - Viechtbauer, Wolfgang

AU - van Os, Jim

AU - van Winkel, Ruud

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KW - psychosis

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SP - S123-S130

JO - Schizophrenia Bulletin

JF - Schizophrenia Bulletin

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Access to Document

10.1093/schbul/sbt150