Psychometric liability to psychosis and childhood adversities are associated with shorter telomere length: A study on schizophrenia patients, unaffected siblings, and non-clinical controls

Burcu Cevik, Oyku Mance-Calisir, Esref Cem Atbasoglu, Meram Can Saka, Koksal Alptekin, Alp Ucok, Burcu Sirmatel, Sinan Guloksuz, Ajlan Tukun, Jim van Os, Guvem Gumus-Akay*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)169-185
Number of pages17
JournalJournal of Psychiatric Research
Volume111
DOIs
Publication statusPublished - Apr 2019

Keywords

  • Telomere length
  • Schizophrenia
  • Healthy siblings
  • Psychometric liability to psychosis
  • Childhood trauma
  • Resilience
  • EMOTIONAL INTELLIGENCE
  • STRUCTURED INTERVIEW
  • DISORDERS
  • STRESS
  • RELIABILITY
  • ENVIRONMENT
  • MECHANISMS
  • EROSION
  • TRAUMA
  • SIS

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