Patent Quality: does one-size-fit all?

N Naina

Research output: Working paper / Preprint › Working paper

Series	EIPIN – IS Research Paper
Volume	19-02

Access to Document

@techreport{7ff4eeb47f034ebebcdefe50468cf67a,

title = "Patent Quality: does one-size-fit all?",

author = "N Naina",

year = "2019",

language = "English",

series = "EIPIN – IS Research Paper",

pages = "16",

publisher = "EIPIN-Innovation Society",

address = "Netherlands",

type = "WorkingPaper",

institution = "EIPIN-Innovation Society",

}