Research output

Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF)

Research output: Contribution to journalArticleAcademicpeer-review

Associated researcher

  • Heering, H. D.
  • Goedhart, S.
  • Bruggeman, R.
  • Cahn, W.
  • de Haan, L.
  • Kahn, R. S.
  • Meijer, C. J.
  • Germeys, I.Y.R.

  • van Os, J.
  • Wiersma, D.

Associated organisations

    Research areas

  • Self-Experience Lifetime Frequency scale, Self-disturbance, Depersonalization, Psychotic disorder
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Details

Original languageEnglish
Pages (from-to)69-76
JournalPsychopathology
Volume49
Issue number2
DOIs
Publication statusPublished - 2016