Understanding Detrimental and Beneficial Grain Boundary Effects in Halide Perovskites

Gede W. P. Adhyaksa, Sarah Brittman, Haralds Abolins, Andries Lof, Xueying Li, Joel D. Keelor, Yanqi Luo, Teodor Duevski, Ron M. A. Heeren, Shane R. Ellis, David P. Fenning, Erik C. Garnett*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Article number1804792
Number of pages9
JournalAdvanced Materials
Volume30
Issue number52
DOIs
Publication statusPublished - 27 Dec 2018

Keywords

  • amorphous grain boundaries
  • carrier lifetime
  • diffusion length
  • electron backscatter diffraction (EBSD)
  • grain size effect
  • halide perovskites
  • mobility
  • METHYLAMMONIUM LEAD IODIDE
  • SOLAR-CELLS
  • POLYCRYSTALLINE SILICON
  • MULTICRYSTALLINE SILICON
  • DIFFUSION LENGTHS
  • RECOMBINATION
  • FILMS
  • PHOTOLUMINESCENCE
  • PERFORMANCE
  • ENERGY

Cite this

Adhyaksa, G. W. P., Brittman, S., Abolins, H., Lof, A., Li, X., Keelor, J. D., Luo, Y., Duevski, T., Heeren, R. M. A., Ellis, S. R., Fenning, D. P., & Garnett, E. C. (2018). Understanding Detrimental and Beneficial Grain Boundary Effects in Halide Perovskites. Advanced Materials, 30(52), [1804792]. https://doi.org/10.1002/adma.201804792