ToF-SIMS Parallel Imaging MS/MS of Lead Soaps in Embedded Paint Cross Sections

Kimberly G. Garcia, Philippe Massonnet, Sebastiaan Van Nuffel, Ron M. A. Heeren*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

In the field of cultural heritage, and more specifically in oil paintings, the ability to unambiguously identify and locate metal soaps is of great interest for a better understanding of painting degradation. Here, we demonstrate the use of a Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) instrument capable of tandem mass spectrometry imaging for the unambiguous identification and localization of lead soaps in cross sections of samples of old oil paintings at high spatial resolution. It is shown that the specific fragmentation pattern of lead soaps is dictated by the loss of the lead ion and that fragmentation occurs on the hydrocarbon chains of the fatty acids. This method offers new opportunities for a better understanding of the chemical changes in aging oil paint samples as well as investigation of organic pigments and binders.
Original languageEnglish
Pages (from-to)1054-1058
Number of pages5
JournalAnalytical Chemistry
Volume97
Issue number2
DOIs
Publication statusPublished - 21 Jan 2025

Keywords

  • OIL

Fingerprint

Dive into the research topics of 'ToF-SIMS Parallel Imaging MS/MS of Lead Soaps in Embedded Paint Cross Sections'. Together they form a unique fingerprint.

Cite this