Time-of-Flight Secondary Ion Mass Spectrometry Imaging of Cross Sections from the Bacchanals Paintings of Nicolas Poussin

Keyphrases

• Mass Spectrometry Imaging 100%
• Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) 100%
• Nicolas Poussin 100%
• Binding Media 66%
• Italy 33%
• Lipids 33%
• Mass Spectrometry 33%
• Secondary Ion 33%
• High Mass Resolution 33%
• Physical Properties 33%
• Mass Spectrometry Analysis 33%
• High-resolution Image 33%
• Binder 33%
• Working Methods 33%
• Emulsion 33%
• Rome 33%
• Microtome 33%
• Organic Matter 33%
• Vacuum Chamber 33%
• Inorganic Materials 33%
• Submicron Resolution 33%
• Paint Cross Sections 33%
• Delay Extraction 33%
• Argon Gas Cluster Ion Beam 33%
• Egg Bound 33%
• Museo 33%
• Bismuth Clusters 33%
• Gas Cluster Ion Beam 33%
• Early Career 33%
• Instrument Settings 33%
• Dual-beam 33%
• Liquid Metal Ion Source 33%

INIS

• ions 100%
• time-of-flight method 100%
• mass spectrometry 100%
• cross sections 100%
• paintings 100%
• images 40%
• gases 40%
• resolution 40%
• italy 40%
• surfaces 40%
• oils 40%
• ion beams 40%
• clusters (ion) 40%
• detection 20%
• infants 20%
• mapping 20%
• beams 20%
• hypothesis 20%
• extraction 20%
• lipids 20%
• cutting 20%
• binders 20%
• eggs 20%
• mass resolution 20%
• physical properties 20%
• emulsions 20%
• argon 20%
• bismuth 20%
• guns 20%
• polishing 20%
• liquid metals 20%

Chemistry

• Imaging Mass Spectrometry 100%
• Time-of-Flight Secondary Ion Mass Spectrometry 100%
• Ion Beam 66%
• Cluster Ion 66%
• Mass Spectrometry 33%
• Mass Spectrometry 33%
• Secondary Ion 33%
• Argon 33%
• Bismuth 33%
• Metal Ion 33%
• Vacuum Chamber 33%