The merit of ipsative measurement : second thoughts and minute doubts

A.L.M. de Vries

Research output: ThesisDoctoral ThesisInternal

67 Downloads (Pure)
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Maastricht University
Supervisors/Advisors
  • van Heerden, Jaap, Supervisor
  • Mellenbergh, G.J., Supervisor, External person
Award date1 Dec 2006
Place of PublicationEnschede
Publisher
Print ISBNs9789090212500
Publication statusPublished - 1 Jan 2006

Cite this

de Vries, A. L. M. (2006). The merit of ipsative measurement : second thoughts and minute doubts. PrintPartners Ipsikamp.