The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging

Gregory L. Fisher; John S. Hammond; Scott R. Bryan; Paul E. Larson; Ron M. A. Heeren

doi:10.1017/S1431927617000654

The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging

Gregory L. Fisher^*, John S. Hammond, Scott R. Bryan, Paul E. Larson, Ron M. A. Heeren

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

We present the first demonstration of a general method for the chemical characterization of small surface features at high magnification via simultaneous collection of mass spectrometry (MS) imaging and tandem MS imaging data. High lateral resolution tandem secondary ion MS imaging is employed to determine the composition of surface features on poly(ethylene terephthalate) (PET) that precipitate during heat treatment. The surface features, probed at a lateral resolving power of

Original language	English
Pages (from-to)	843-848
Number of pages	6
Journal	Microscopy and Microanalysis
Volume	23
Issue number	4
DOIs	https://doi.org/10.1017/S1431927617000654
Publication status	Published - Aug 2017

Keywords

mass spectrometry imaging
tandem MS imaging
molecular identification
polymer surface analysis
TOF-SIMS
CRYSTALLIZATION
SIMS

Access to Document

10.1017/S1431927617000654

Full TextFinal published version, 648 KBLicence: Taverne

Cite this

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abstract = "We present the first demonstration of a general method for the chemical characterization of small surface features at high magnification via simultaneous collection of mass spectrometry (MS) imaging and tandem MS imaging data. High lateral resolution tandem secondary ion MS imaging is employed to determine the composition of surface features on poly(ethylene terephthalate) (PET) that precipitate during heat treatment. The surface features, probed at a lateral resolving power of",

keywords = "mass spectrometry imaging, tandem MS imaging, molecular identification, polymer surface analysis, TOF-SIMS, CRYSTALLIZATION, SIMS",

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AU - Larson, Paul E.

AU - Heeren, Ron M. A.

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KW - mass spectrometry imaging

KW - tandem MS imaging

KW - molecular identification

KW - polymer surface analysis

KW - TOF-SIMS

KW - CRYSTALLIZATION

KW - SIMS

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DO - 10.1017/S1431927617000654

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