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Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope
A. H. Tavabi, P. Rosi, R. B. G. Ravelli, A. Gijsbers, E. Rotunno, T. Guner, Y. Zhang, A. Roncaglia, L. Belsito, G. Pozzi, T. Denneulin, G. C. Gazzadi, M. Ghosh, R. Nijland, S. Frabboni, P. J. Peters, E. Karimi, P. Tiemeijer, R. E. Dunin-Borkowski, V. Grillo*
*Corresponding author for this work
Research output: Contribution to journal › Article › Academic › peer-review
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