Single-particle cryo-EM: alternative schemes to improve dose efficiency

Y. Zhang, P.H. Lu, E. Rotunno, F. Troiani, J.P. van Schayck, A.H. Tavabi, R.E. Dunin-Borkowski, V. Grillo, P.J. Peters, R.B.G. Ravelli*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

Imaging of biomolecules by ionizing radiation, such as electrons, causes radiation damage which introduces structural and compositional changes of the specimen. The total number of high-energy electrons per surface area that can be used for imaging in cryogenic electron microscopy (cryo-EM) is severely restricted due to radiation damage, resulting in low signal-to-noise ratios (SNR). High resolution details are dampened by the transfer function of the microscope and detector, and are the first to be lost as radiation damage alters the individual molecules which are presumed to be identical during averaging. As a consequence, radiation damage puts a limit on the particle size and sample heterogeneity with which electron microscopy (EM) can deal. Since a transmission EM (TEM) image is formed from the scattering process of the electron by the specimen interaction potential, radiation damage is inevitable. However, we can aim to maximize the information transfer for a given dose and increase the SNR by finding alternatives to the conventional phase-contrast cryo-EM techniques. Here some alternative transmission electron microscopy techniques are reviewed, including phase plate, multi-pass transmission electron microscopy, off-axis holography, ptychography and a quantum sorter. Their prospects for providing more or complementary structural information within the limited lifetime of the sample are discussed.
Original languageEnglish
Pages (from-to)1343-1356
Number of pages14
JournalJournal of Synchrotron Radiation
Volume28
DOIs
Publication statusPublished - 1 Sept 2021
Event11th International Workshop on X-Ray Radiation Damage to Biological Crystalline Samples - Online, Paul Scherrer Institut, Villigen, Switzerland
Duration: 14 Oct 202016 Oct 2020
Conference number: 11
https://indico.psi.ch/event/7811/

Keywords

  • phase plate
  • multi-pass TEM
  • holography
  • ptychography
  • quantum sorter
  • SHIFTING ELECTRON HOLOGRAPHY
  • ZERNIKE PHASE PLATES
  • RADIATION-DAMAGE
  • CRYOELECTRON MICROSCOPY
  • X-RAYS
  • CONTRAST
  • PTYCHOGRAPHY
  • TOMOGRAPHY
  • NANOMETER
  • LIMITATIONS

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