Reliability Knowledge Discovery: Reliability Issues in Knowledge Discovery (RIKD 2012), in: Workshops Proceedings of the 12th IEEE International Conference on Data Mining (ICDM 2012)

H. Dai (Editor), J. Liu (Editor), Evgueni Smirnov (Editor)

Research output: Book/ReportBook editing

Original languageEnglish
PublisherSpringer
Publication statusPublished - 2012

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