Psychotic Experiences and Related Distress: A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries

Caroline Wusten; Bjorn Schlier; Edo S. Jaya; Behrooz Z. Alizadeh; Agna A. Bartels-Velthuis; Nico J. van Beveren; Richard Bruggeman; Wiepke Cahn; Lieuwe de Haan; Philippe Delespaul; Carin J. Meijer; Inez Myin-Germeys; Rene S. Kahn; Frederike Schirmbeck; Claudia J. P. Simons; Neeltje E. van Haren; Jim van Os; Ruud van Winkel; Eduardo Fonseca-Pedrero; Emmanuelle Peters; Helene Verdoux; Todd S. Woodward; Tim B. Ziermans; Tania M. Lincoln; Genetic Risk and Outcome of Psychosis (GROUP) Investigators

doi:10.1093/schbul/sby087

Psychotic Experiences and Related Distress: A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries

Caroline Wusten^*, Bjorn Schlier, Edo S. Jaya, Behrooz Z. Alizadeh, Agna A. Bartels-Velthuis, Nico J. van Beveren, Richard Bruggeman, Wiepke Cahn, Lieuwe de Haan, Philippe Delespaul, Carin J. Meijer, Inez Myin-Germeys, Rene S. Kahn, Frederike Schirmbeck, Claudia J. P. Simons, Neeltje E. van Haren, Jim van Os, Ruud van Winkel, Eduardo Fonseca-Pedrero, Emmanuelle PetersHelene Verdoux, Todd S. Woodward, Tim B. Ziermans, Tania M. Lincoln, Genetic Risk and Outcome of Psychosis (GROUP) Investigators

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	1185-1194
Number of pages	10
Journal	Schizophrenia Bulletin
Volume	44
Issue number	6
DOIs	https://doi.org/10.1093/schbul/sby087
Publication status	Published - Nov 2018

Keywords

psychosis continuum
high-risk status
psychosis phenotype
culture
cross-cultural comparison
CAPE
network approach
epidemiology
schizophrenia
CONFIRMATORY FACTOR-ANALYSIS
COMMUNITY ASSESSMENT
GENERAL-POPULATION
SYMPTOMS
METAANALYSIS
DIMENSIONS
DEPRESSION
CONTINUUM
MODEL
RISK

Access to Document

10.1093/schbul/sby087

Cite this

Wusten, C., Schlier, B., Jaya, E. S., Alizadeh, B. Z., Bartels-Velthuis, A. A., van Beveren, N. J., Bruggeman, R., Cahn, W., de Haan, L., Delespaul, P., Meijer, C. J., Myin-Germeys, I., Kahn, R. S., Schirmbeck, F., Simons, C. J. P., van Haren, N. E., van Os, J., van Winkel, R., Fonseca-Pedrero, E., ... Genetic Risk and Outcome of Psychosis (GROUP) Investigators (2018). Psychotic Experiences and Related Distress: A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries. Schizophrenia Bulletin, 44(6), 1185-1194. https://doi.org/10.1093/schbul/sby087

Wusten, Caroline ; Schlier, Bjorn ; Jaya, Edo S. ; Alizadeh, Behrooz Z. ; Bartels-Velthuis, Agna A. ; van Beveren, Nico J. ; Bruggeman, Richard ; Cahn, Wiepke ; de Haan, Lieuwe ; Delespaul, Philippe ; Meijer, Carin J. ; Myin-Germeys, Inez ; Kahn, Rene S. ; Schirmbeck, Frederike ; Simons, Claudia J. P. ; van Haren, Neeltje E. ; van Os, Jim ; van Winkel, Ruud ; Fonseca-Pedrero, Eduardo ; Peters, Emmanuelle ; Verdoux, Helene ; Woodward, Todd S. ; Ziermans, Tim B. ; Lincoln, Tania M. ; Genetic Risk and Outcome of Psychosis (GROUP) Investigators. / Psychotic Experiences and Related Distress : A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries. In: Schizophrenia Bulletin. 2018 ; Vol. 44, No. 6. pp. 1185-1194.

@article{99a9da3703a246158cba29b7e89c4fc9,

title = "Psychotic Experiences and Related Distress: A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries",

keywords = "psychosis continuum, high-risk status, psychosis phenotype, culture, cross-cultural comparison, CAPE, network approach, epidemiology, schizophrenia, CONFIRMATORY FACTOR-ANALYSIS, COMMUNITY ASSESSMENT, GENERAL-POPULATION, SYMPTOMS, METAANALYSIS, DIMENSIONS, DEPRESSION, CONTINUUM, MODEL, RISK",

author = "Caroline Wusten and Bjorn Schlier and Jaya, {Edo S.} and Alizadeh, {Behrooz Z.} and Bartels-Velthuis, {Agna A.} and {van Beveren}, {Nico J.} and Richard Bruggeman and Wiepke Cahn and {de Haan}, Lieuwe and Philippe Delespaul and Meijer, {Carin J.} and Inez Myin-Germeys and Kahn, {Rene S.} and Frederike Schirmbeck and Simons, {Claudia J. P.} and {van Haren}, {Neeltje E.} and {van Os}, Jim and {van Winkel}, Ruud and Eduardo Fonseca-Pedrero and Emmanuelle Peters and Helene Verdoux and Woodward, {Todd S.} and Ziermans, {Tim B.} and Lincoln, {Tania M.} and {Genetic Risk and Outcome of Psychosis (GROUP) Investigators}",

year = "2018",

month = nov,

doi = "10.1093/schbul/sby087",

language = "English",

volume = "44",

pages = "1185--1194",

journal = "Schizophrenia Bulletin",

issn = "0586-7614",

publisher = "Oxford University Press",

number = "6",

}

Wusten, C, Schlier, B, Jaya, ES, Alizadeh, BZ, Bartels-Velthuis, AA, van Beveren, NJ, Bruggeman, R, Cahn, W, de Haan, L, Delespaul, P, Meijer, CJ, Myin-Germeys, I, Kahn, RS, Schirmbeck, F, Simons, CJP, van Haren, NE, van Os, J, van Winkel, R, Fonseca-Pedrero, E, Peters, E, Verdoux, H, Woodward, TS, Ziermans, TB, Lincoln, TM & Genetic Risk and Outcome of Psychosis (GROUP) Investigators 2018, 'Psychotic Experiences and Related Distress: A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries', Schizophrenia Bulletin, vol. 44, no. 6, pp. 1185-1194. https://doi.org/10.1093/schbul/sby087

Psychotic Experiences and Related Distress : A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries. / Wusten, Caroline; Schlier, Bjorn; Jaya, Edo S.; Alizadeh, Behrooz Z.; Bartels-Velthuis, Agna A.; van Beveren, Nico J.; Bruggeman, Richard; Cahn, Wiepke; de Haan, Lieuwe; Delespaul, Philippe; Meijer, Carin J.; Myin-Germeys, Inez; Kahn, Rene S.; Schirmbeck, Frederike; Simons, Claudia J. P.; van Haren, Neeltje E.; van Os, Jim; van Winkel, Ruud; Fonseca-Pedrero, Eduardo; Peters, Emmanuelle; Verdoux, Helene; Woodward, Todd S.; Ziermans, Tim B.; Lincoln, Tania M.; Genetic Risk and Outcome of Psychosis (GROUP) Investigators.

In: Schizophrenia Bulletin, Vol. 44, No. 6, 11.2018, p. 1185-1194.

Research output: Contribution to journal › Article › Academic › peer-review

TY - JOUR

T1 - Psychotic Experiences and Related Distress

T2 - A Cross-national Comparison and Network Analysis Based on 7141 Participants From 13 Countries

AU - Wusten, Caroline

AU - Schlier, Bjorn

AU - Jaya, Edo S.

AU - Alizadeh, Behrooz Z.

AU - Bartels-Velthuis, Agna A.

AU - van Beveren, Nico J.

AU - Bruggeman, Richard

AU - Cahn, Wiepke

AU - de Haan, Lieuwe

AU - Delespaul, Philippe

AU - Meijer, Carin J.

AU - Myin-Germeys, Inez

AU - Kahn, Rene S.

AU - Schirmbeck, Frederike

AU - Simons, Claudia J. P.

AU - van Haren, Neeltje E.

AU - van Os, Jim

AU - van Winkel, Ruud

AU - Fonseca-Pedrero, Eduardo

AU - Peters, Emmanuelle

AU - Verdoux, Helene

AU - Woodward, Todd S.

AU - Ziermans, Tim B.

AU - Lincoln, Tania M.

AU - Genetic Risk and Outcome of Psychosis (GROUP) Investigators

PY - 2018/11

Y1 - 2018/11

KW - psychosis continuum

KW - high-risk status

KW - psychosis phenotype

KW - culture

KW - cross-cultural comparison

KW - CAPE

KW - network approach

KW - epidemiology

KW - schizophrenia

KW - CONFIRMATORY FACTOR-ANALYSIS

KW - COMMUNITY ASSESSMENT

KW - GENERAL-POPULATION

KW - SYMPTOMS

KW - METAANALYSIS

KW - DIMENSIONS

KW - DEPRESSION

KW - CONTINUUM

KW - MODEL

KW - RISK

U2 - 10.1093/schbul/sby087

DO - 10.1093/schbul/sby087

M3 - Article

VL - 44

SP - 1185

EP - 1194

JO - Schizophrenia Bulletin

JF - Schizophrenia Bulletin

SN - 0586-7614

IS - 6

ER -