Optical absorption measurements on crystalline silicon test masses at 1550 nm

J. Steinlechner, C. Kruger, N. Lastzka, S. Steinlechner, A. Khalaidovski, R. Schnabel*

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Web of Science)

Abstract

Crystalline silicon is currently being discussed as test-mass material for future generations of gravitational wave detectors that will operate at cryogenic temperatures. We present optical absorption measurements on a large-dimension sample of crystalline silicon at a wavelength of 1550 nm at room temperature. The absorption was measured in a high-intensity monolithic cavity setup using the photo-thermal self-phase modulation technique. The result for the absorption coefficient of this sample with a specific resistivity of 11 k Omega cm was measured to be alpha(A) = (264 +/- 39) ppm cm(-1) for an intensity of 700 W cm(-2).
Original languageEnglish
Article number095007
Number of pages10
JournalClassical and Quantum Gravity
Volume30
Issue number9
DOIs
Publication statusPublished - 7 May 2013
Externally publishedYes

Keywords

  • FUSED-SILICA
  • FREQUENCY
  • EDGE

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