On Resolution in Electron Tomography of Beam Sensitive Materials

Delei Chen, Heiner Friedrich*, Gijsbertus de With

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)1248-1257
JournalJournal of Physical Chemistry C
Volume118
Issue number2
DOIs
Publication statusPublished - 2014
Externally publishedYes

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