Multi-voxel pattern analysis of valence in depression

I. Habes, S. Krall, S. Johnston, K. Yuen, D. Healy, R. Goebel, B. Sorger, D. Linden

Research output: Contribution to conference › Abstract › Academic

Habes, I., Krall, S., Johnston, S., Yuen, K., Healy, D., Goebel, R., Sorger, B., & Linden, D. (2013). Multi-voxel pattern analysis of valence in depression. 218-218.

@conference{447151e678714af295188807d85cc8b5,

title = "Multi-voxel pattern analysis of valence in depression",

author = "I. Habes and S. Krall and S. Johnston and K. Yuen and D. Healy and R. Goebel and B. Sorger and D. Linden",

note = "Journal of Cognitive Neuroscience ",

year = "2013",

month = jan

day = "1",

language = "English",

pages = "218--218",

}