Multi-voxel pattern analysis of valence in depression

I. Habes, S. Krall, S. Johnston, K. Yuen, D. Healy, R. Goebel, B. Sorger, D. Linden

Research output: Contribution to conferenceAbstractAcademic

Original languageEnglish
Pages218-218
Publication statusPublished - 1 Jan 2013

Cite this

Habes, I., Krall, S., Johnston, S., Yuen, K., Healy, D., Goebel, R., Sorger, B., & Linden, D. (2013). Multi-voxel pattern analysis of valence in depression. 218-218.