Multi-voxel pattern analysis of valence in depression

I. Habes, S. Krall, S. Johnston, K. Yuen, D. Healy, R. Goebel, B. Sorger, D. Linden

Research output: Contribution to conference › Abstract › Academic

Original language	English
Pages	218-218
Publication status	Published - 1 Jan 2013

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Habes, I., Krall, S., Johnston, S., Yuen, K., Healy, D., Goebel, R., Sorger, B., & Linden, D. (2013). Multi-voxel pattern analysis of valence in depression. 218-218. http://apps.webofknowledge.com/InboundService.do?SID=2AHL%40La65nl11Aa26KO&product=WOS&UT=000317030501211&SrcApp=EndNote&DestFail=http%3A%2F%2Fwww.webofknowledge.com&Init=Yes&action=retrieve&Func=Frame&customersID=ResearchSoft&SrcAuth=ResearchSoft&IsProductCode=Yes&mode=FullRecord

@conference{447151e678714af295188807d85cc8b5,

title = "Multi-voxel pattern analysis of valence in depression",

author = "I. Habes and S. Krall and S. Johnston and K. Yuen and D. Healy and R. Goebel and B. Sorger and D. Linden",

note = "Journal of Cognitive Neuroscience ",

year = "2013",

month = jan,

day = "1",

language = "English",

pages = "218--218",

}

Habes, I, Krall, S, Johnston, S, Yuen, K, Healy, D, Goebel, R , Sorger, B & Linden, D 2013, 'Multi-voxel pattern analysis of valence in depression', pp. 218-218. <http://apps.webofknowledge.com/InboundService.do?SID=2AHL%40La65nl11Aa26KO&product=WOS&UT=000317030501211&SrcApp=EndNote&DestFail=http%3A%2F%2Fwww.webofknowledge.com&Init=Yes&action=retrieve&Func=Frame&customersID=ResearchSoft&SrcAuth=ResearchSoft&IsProductCode=Yes&mode=FullRecord>