Multi-voxel pattern analysis of valence in depression

I. Habes, S. Krall, S. Johnston, K. Yuen, D. Healy, R. Goebel, B. Sorger, D. Linden

Research output: Contribution to conferenceAbstractAcademic

Original languageEnglish
Pages218-218
Publication statusPublished - 1 Jan 2013

Cite this

Habes, I., Krall, S., Johnston, S., Yuen, K., Healy, D., Goebel, R., ... Linden, D. (2013). Multi-voxel pattern analysis of valence in depression. 218-218.
Habes, I. ; Krall, S. ; Johnston, S. ; Yuen, K. ; Healy, D. ; Goebel, R. ; Sorger, B. ; Linden, D. / Multi-voxel pattern analysis of valence in depression.
@conference{447151e678714af295188807d85cc8b5,
title = "Multi-voxel pattern analysis of valence in depression",
author = "I. Habes and S. Krall and S. Johnston and K. Yuen and D. Healy and R. Goebel and B. Sorger and D. Linden",
note = "Journal of Cognitive Neuroscience",
year = "2013",
month = "1",
day = "1",
language = "English",
pages = "218--218",

}

Habes, I, Krall, S, Johnston, S, Yuen, K, Healy, D, Goebel, R, Sorger, B & Linden, D 2013, 'Multi-voxel pattern analysis of valence in depression', pp. 218-218.

Multi-voxel pattern analysis of valence in depression. / Habes, I.; Krall, S.; Johnston, S.; Yuen, K.; Healy, D.; Goebel, R.; Sorger, B.; Linden, D.

2013. 218-218.

Research output: Contribution to conferenceAbstractAcademic

TY - CONF

T1 - Multi-voxel pattern analysis of valence in depression

AU - Habes, I.

AU - Krall, S.

AU - Johnston, S.

AU - Yuen, K.

AU - Healy, D.

AU - Goebel, R.

AU - Sorger, B.

AU - Linden, D.

N1 - Journal of Cognitive Neuroscience

PY - 2013/1/1

Y1 - 2013/1/1

M3 - Abstract

SP - 218

EP - 218

ER -

Habes I, Krall S, Johnston S, Yuen K, Healy D, Goebel R et al. Multi-voxel pattern analysis of valence in depression. 2013.