@inbook{ba577e59c4e34d3ea6d65661abd7a744,
title = "High-performance Analysers in SIMS",
abstract = "Secondary ion mass spectrometry (SIMS) is at an exciting juncture of technological advances in mass spectrometer designs and new ion beams that have rapidly accelerated its capabilities for advanced measurements in science and technology. Innovation in ion beams is enabling the desorption and ionization of biomolecules that previously could not be detected. Recent advances in novel high-resolution mass spectrometers provide the ability to identify these ions with higher sensitivity and higher confidence in identification than ever before. This chapter presents the concept and applications of recent high-performance and MS/MS analysers in SIMS.",
author = "Trindade, \{Gustavo F.\} and Garcia, \{Kimberly G.\} and Heeren, \{Ron M. A.\} and Nuffel, \{Sebastiaan Van\} and Hua Tian and Gilmore, \{Ian. S.\}",
year = "2025",
month = jun,
day = "6",
doi = "10.1039/9781837674763-00133",
language = "English",
isbn = "978-1-83767-100-7",
series = "New Developments in Mass Spectrometry",
publisher = "Royal Society of Chemistry",
pages = "133--158",
editor = "Micha{\l}owski, \{Pawe{\l} Piotr\}",
booktitle = "Secondary Ion Mass Spectrometry",
address = "United Kingdom",
}