Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints

Karolien Bers; Kasper Eersels; Bart van Grinsven; Mat Daemen; Jeroen F. J. Bogie; Jerome J. A. Hendriks; Evelien E. Bouwmans; Christiane Puettmann; Christoph Stein; Stefan Barth; Gerard M. J. Bos; Wilfred T. V. Germeraad; Ward De Ceuninck; Patrick Wagner

doi:10.1021/la5001232

Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints

Karolien Bers, Kasper Eersels, Bart van Grinsven, Mat Daemen, Jeroen F. J. Bogie, Jerome J. A. Hendriks, Evelien E. Bouwmans, Christiane Puettmann, Christoph Stein, Stefan Barth, Gerard M. J. Bos, Wilfred T. V. Germeraad, Ward De Ceuninck, Patrick Wagner^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	3631-3639
Journal	Langmuir
Volume	30
Issue number	12
DOIs	https://doi.org/10.1021/la5001232
Publication status	Published - 1 Apr 2014

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10.1021/la5001232

Cite this

Bers, K., Eersels, K., van Grinsven, B., Daemen, M., Bogie, J. F. J., Hendriks, J. J. A., Bouwmans, E. E., Puettmann, C., Stein, C., Barth, S., Bos, G. M. J., Germeraad, W. T. V., De Ceuninck, W., & Wagner, P. (2014). Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints. Langmuir, 30(12), 3631-3639. https://doi.org/10.1021/la5001232

Bers, Karolien ; Eersels, Kasper ; van Grinsven, Bart ; Daemen, Mat ; Bogie, Jeroen F. J. ; Hendriks, Jerome J. A. ; Bouwmans, Evelien E. ; Puettmann, Christiane ; Stein, Christoph ; Barth, Stefan ; Bos, Gerard M. J. ; Germeraad, Wilfred T. V. ; De Ceuninck, Ward ; Wagner, Patrick. / Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints. In: Langmuir. 2014 ; Vol. 30, No. 12. pp. 3631-3639.

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title = "Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints",

author = "Karolien Bers and Kasper Eersels and {van Grinsven}, Bart and Mat Daemen and Bogie, {Jeroen F. J.} and Hendriks, {Jerome J. A.} and Bouwmans, {Evelien E.} and Christiane Puettmann and Christoph Stein and Stefan Barth and Bos, {Gerard M. J.} and Germeraad, {Wilfred T. V.} and {De Ceuninck}, Ward and Patrick Wagner",

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issn = "0743-7463",

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Bers, K, Eersels, K , van Grinsven, B, Daemen, M, Bogie, JFJ, Hendriks, JJA, Bouwmans, EE, Puettmann, C, Stein, C, Barth, S, Bos, GMJ , Germeraad, WTV, De Ceuninck, W & Wagner, P 2014, 'Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints', Langmuir, vol. 30, no. 12, pp. 3631-3639. https://doi.org/10.1021/la5001232

Heat-Transfer Resistance Measurement Method (HTM)-Based Cell Detection at Trace Levels Using a Progressive Enrichment Approach with Highly Selective Cell-Binding Surface Imprints. / Bers, Karolien; Eersels, Kasper ; van Grinsven, Bart; Daemen, Mat; Bogie, Jeroen F. J.; Hendriks, Jerome J. A.; Bouwmans, Evelien E.; Puettmann, Christiane; Stein, Christoph; Barth, Stefan; Bos, Gerard M. J.; Germeraad, Wilfred T. V.; De Ceuninck, Ward; Wagner, Patrick.

In: Langmuir, Vol. 30, No. 12, 01.04.2014, p. 3631-3639.

Research output: Contribution to journal › Article › Academic › peer-review

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AU - Daemen, Mat

AU - Bogie, Jeroen F. J.

AU - Hendriks, Jerome J. A.

AU - Bouwmans, Evelien E.

AU - Puettmann, Christiane

AU - Stein, Christoph

AU - Barth, Stefan

AU - Bos, Gerard M. J.

AU - Germeraad, Wilfred T. V.

AU - De Ceuninck, Ward

AU - Wagner, Patrick

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