Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF)

Henriette Dorothee Heering; Saskia Goedhart; Richard Bruggeman; Wiepke Cahn; Lieuwe de Haan; Rene S. Kahn; Carin J. Meijer; Inez Myin-Germeys; Jim van Os; Durk Wiersma

doi:10.1159/000441952

Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF)

Henriette Dorothee Heering, Saskia Goedhart, Richard Bruggeman, Wiepke Cahn, Lieuwe de Haan, Rene S. Kahn, Carin J. Meijer, Inez Myin-Germeys, Jim van Os, Durk Wiersma

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	69-76
Journal	Psychopathology
Volume	49
Issue number	2
DOIs	https://doi.org/10.1159/000441952
Publication status	Published - 2016

Keywords

Self-Experience Lifetime Frequency scale
Self-disturbance
Depersonalization
Psychotic disorder

Access to Document

10.1159/000441952

Cite this

Heering, H. D., Goedhart, S., Bruggeman, R., Cahn, W., de Haan, L., Kahn, R. S., Meijer, C. J., Myin-Germeys, I., van Os, J., & Wiersma, D. (2016). Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF). Psychopathology, 49(2), 69-76. https://doi.org/10.1159/000441952

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title = "Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF)",

keywords = "Self-Experience Lifetime Frequency scale, Self-disturbance, Depersonalization, Psychotic disorder",

author = "Heering, {Henriette Dorothee} and Saskia Goedhart and Richard Bruggeman and Wiepke Cahn and {de Haan}, Lieuwe and Kahn, {Rene S.} and Meijer, {Carin J.} and Inez Myin-Germeys and {van Os}, Jim and Durk Wiersma",

year = "2016",

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language = "English",

volume = "49",

pages = "69--76",

journal = "Psychopathology",

issn = "0254-4962",

publisher = "S. Karger AG",

number = "2",

}

Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF). / Heering, Henriette Dorothee; Goedhart, Saskia; Bruggeman, Richard; Cahn, Wiepke; de Haan, Lieuwe; Kahn, Rene S.; Meijer, Carin J.; Myin-Germeys, Inez; van Os, Jim; Wiersma, Durk.

In: Psychopathology, Vol. 49, No. 2, 2016, p. 69-76.

Research output: Contribution to journal › Article › Academic › peer-review

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T1 - Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF)

AU - Heering, Henriette Dorothee

AU - Goedhart, Saskia

AU - Bruggeman, Richard

AU - Cahn, Wiepke

AU - de Haan, Lieuwe

AU - Kahn, Rene S.

AU - Meijer, Carin J.

AU - Myin-Germeys, Inez

AU - van Os, Jim

AU - Wiersma, Durk

PY - 2016

Y1 - 2016

KW - Self-Experience Lifetime Frequency scale

KW - Self-disturbance

KW - Depersonalization

KW - Psychotic disorder

U2 - 10.1159/000441952

DO - 10.1159/000441952

M3 - Article

VL - 49

SP - 69

EP - 76

JO - Psychopathology

JF - Psychopathology

SN - 0254-4962

IS - 2

ER -