Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF)

Henriette Dorothee Heering, Saskia Goedhart, Richard Bruggeman, Wiepke Cahn, Lieuwe de Haan, Rene S. Kahn, Carin J. Meijer, Inez Myin-Germeys, Jim van Os, Durk Wiersma

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)69-76
JournalPsychopathology
Volume49
Issue number2
DOIs
Publication statusPublished - 2016

Keywords

  • Self-Experience Lifetime Frequency scale
  • Self-disturbance
  • Depersonalization
  • Psychotic disorder

Cite this

Heering, H. D., Goedhart, S., Bruggeman, R., Cahn, W., de Haan, L., Kahn, R. S., Meijer, C. J., Myin-Germeys, I., van Os, J., & Wiersma, D. (2016). Disturbed Experience of Self: Psychometric Analysis of the Self-Experience Lifetime Frequency Scale (SELF). Psychopathology, 49(2), 69-76. https://doi.org/10.1159/000441952