Coping With Memory Effect and Serial Correlation When Estimating Reliability in a Longitudinal Framework

Annouschka Laenen; Ariel Alonso; Geert Molenberghs; Tony Vangeneugden; Craig H. Mallinckrodt

doi:10.1177/0146621609349494

Coping With Memory Effect and Serial Correlation When Estimating Reliability in a Longitudinal Framework

Annouschka Laenen, Ariel Alonso, Geert Molenberghs, Tony Vangeneugden, Craig H. Mallinckrodt

Research output: Contribution to journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	255-266
Journal	Applied Psychological Measurement
Volume	34
Issue number	4
DOIs	https://doi.org/10.1177/0146621609349494
Publication status	Published - Jun 2010

Keywords

hierarchical model
memory effect
rating scales
reliability
serial correlation

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10.1177/0146621609349494

Cite this

Laenen, A., Alonso, A., Molenberghs, G., Vangeneugden, T., & Mallinckrodt, C. H. (2010). Coping With Memory Effect and Serial Correlation When Estimating Reliability in a Longitudinal Framework. Applied Psychological Measurement, 34(4), 255-266. https://doi.org/10.1177/0146621609349494

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AU - Mallinckrodt, Craig H.

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KW - reliability

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