Coping With Memory Effect and Serial Correlation When Estimating Reliability in a Longitudinal Framework

Annouschka Laenen*, Ariel Alonso, Geert Molenberghs, Tony Vangeneugden, Craig H. Mallinckrodt

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Web of Science)
Original languageEnglish
Pages (from-to)255-266
JournalApplied Psychological Measurement
Issue number4
Publication statusPublished - Jun 2010


  • hierarchical model
  • memory effect
  • rating scales
  • reliability
  • serial correlation

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