Original language | English |
---|---|
Pages (from-to) | 255-266 |
Journal | Applied Psychological Measurement |
Volume | 34 |
Issue number | 4 |
DOIs | |
Publication status | Published - Jun 2010 |
Keywords
- hierarchical model
- memory effect
- rating scales
- reliability
- serial correlation
Annouschka Laenen*, Ariel Alonso, Geert Molenberghs, Tony Vangeneugden, Craig H. Mallinckrodt
Research output: Contribution to journal › Article › Academic › peer-review
Original language | English |
---|---|
Pages (from-to) | 255-266 |
Journal | Applied Psychological Measurement |
Volume | 34 |
Issue number | 4 |
DOIs | |
Publication status | Published - Jun 2010 |