Coping With Memory Effect and Serial Correlation When Estimating Reliability in a Longitudinal Framework

Annouschka Laenen, Ariel Alonso, Geert Molenberghs, Tony Vangeneugden, Craig H. Mallinckrodt

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)255-266
JournalApplied Psychological Measurement
Volume34
Issue number4
DOIs
Publication statusPublished - Jun 2010

Keywords

  • hierarchical model
  • memory effect
  • rating scales
  • reliability
  • serial correlation

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