Association between COMT Val158Met genotype and EEG alpha peak frequency tested in two independent cohorts

Cornelis P. M. Veth*, Martijn Arns, Wilhelmus Drinkenburg, Willem Talloen, Pieter J. Peeters, Evian Gordon, Jan K. Buitelaar

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)221-224
Number of pages4
JournalPsychiatry Research
Volume219
Issue number1
DOIs
Publication statusPublished - 30 Sep 2014
Externally publishedYes

Keywords

  • Catechol-O-Methyltransferase Val158Met polymorphism
  • Electroencephalographic alpha peak frequency
  • Major depressive disorder
  • O-METHYLTRANSFERASE COMT
  • TEST-RETEST RELIABILITY
  • PHARMACOGENETICS
  • DEPRESSION
  • POLYMORPHISM
  • VALIDATION
  • MECHANISMS
  • PHENOTYPES
  • ANXIETY
  • POWER

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