Accounting for partiality in serial crystallography using ray-tracing principles

Loes M. J. Kroon-Batenburg*, Antoine M. M. Schreurs, Raimond B. G. Ravelli, Piet Gros

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Web of Science)
Original languageEnglish
Pages (from-to)1799-1811
JournalActa Crystallographica. Section D: Structural Biology
Publication statusPublished - Sep 2015


  • serial crystallography
  • EVAL
  • partiality of still data

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