A New Method and Mass Spectrometer Design for TOF-SIMS Parallel Imaging MS/MS

Keyphrases

• Parallel Imaging 100%
• Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) 100%
• Imaging MS 100%
• MS-MS 100%
• Mass Spectrometer 100%
• Spectrometer Design 100%
• Mass Spectrometry Methods 25%
• Lateral Resolution 25%
• Secondary Ion 25%
• Ion Beam 25%
• Precursor Ions 25%
• Molecular Identification 25%
• Abundance Sensitivity 25%
• Molecular Surface Analysis 25%
• Complex Matrices 25%
• Specific Ion 25%
• Ion Dose 25%
• Molecular Damage 25%
• Tandem Mass 25%
• Surface Screening 25%
• Tandem Mass Spectrometry Imaging 25%
• Dose-dense 25%
• High Abundance 25%
• Lower Primary 25%
• Nanometer Scale 25%
• One-of-a-kind 25%
• Matrix Components 25%
• Spectrometer 25%
• MS Imaging 25%
• Multicomponent Samples 25%

INIS

• ions 100%
• design 100%
• mass spectrometers 100%
• sims 100%
• matrices 28%
• surfaces 28%
• screening 14%
• data 14%
• doses 14%
• sensitivity 14%
• damage 14%
• comparative evaluations 14%
• density 14%
• mass spectrometry 14%
• resolution 14%
• precursor 14%
• chemistry 14%
• molecules 14%
• exceptions 14%
• abundance 14%
• streams 14%
• mass spectroscopy 14%
• ion beams 14%
• spectrometers 14%

Chemistry

• Tandem Mass Spectrometry 100%
• Parallel Imaging 100%
• Time-of-Flight Secondary Ion Mass Spectrometry 100%
• Mass Spectrometer Designs 100%
• Mass Spectrometry 25%
• Chemistry 25%
• Molecular Surface 25%
• Imaging Mass Spectrometry 25%
• Ion Beam 25%
• Secondary Ion 25%
• Surface Analysis 25%