| Original language | English |
|---|---|
| Pages (from-to) | 2217-2228 |
| Number of pages | 12 |
| Journal | Journal of Analytical Atomic Spectrometry |
| Volume | 34 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1 Nov 2019 |
Keywords
- ION MASS-SPECTROMETRY
- METAL-ASSISTED SIMS
- PRINCIPAL COMPONENT ANALYSIS
- ADSORBED PROTEIN FILMS
- CLUSTER ION
- DESORPTION IONIZATION
- SPATIAL-RESOLUTION
- SAMPLE PREPARATION
- MALDI-MS
- LIPIDS
Cite this
}
A concise tutorial review of TOF-SIMS based molecular and cellular imaging. / Massonnet, Philippe; Heeren, Ron M. A.
In: Journal of Analytical Atomic Spectrometry, Vol. 34, No. 11, 01.11.2019, p. 2217-2228.Research output: Contribution to journal › Review article › Academic › peer-review
TY - JOUR
T1 - A concise tutorial review of TOF-SIMS based molecular and cellular imaging
AU - Massonnet, Philippe
AU - Heeren, Ron M. A.
PY - 2019/11/1
Y1 - 2019/11/1
KW - ION MASS-SPECTROMETRY
KW - METAL-ASSISTED SIMS
KW - PRINCIPAL COMPONENT ANALYSIS
KW - ADSORBED PROTEIN FILMS
KW - CLUSTER ION
KW - DESORPTION IONIZATION
KW - SPATIAL-RESOLUTION
KW - SAMPLE PREPARATION
KW - MALDI-MS
KW - LIPIDS
U2 - 10.1039/c9ja00164f
DO - 10.1039/c9ja00164f
M3 - Review article
VL - 34
SP - 2217
EP - 2228
JO - Journal of Analytical Atomic Spectrometry
JF - Journal of Analytical Atomic Spectrometry
SN - 0267-9477
IS - 11
ER -