A concise tutorial review of TOF-SIMS based molecular and cellular imaging

Philippe Massonnet; Ron M. A. Heeren

doi:10.1039/c9ja00164f

A concise tutorial review of TOF-SIMS based molecular and cellular imaging

Philippe Massonnet, Ron M. A. Heeren^*

^*Corresponding author for this work

Research output: Contribution to journal › (Systematic) Review article › peer-review

98 Downloads (Pure)

Abstract

This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined with a signal enhancement method depending on the surface under investigation. The types of detected molecules and methods for molecular identification in SIMS are strongly determined by this combination of ionization method and sample preparation. The use of TOF-SIMS for single cell and three-dimensional imaging will be discussed in the context of selected applications. Finally we will discuss an outlook on the application of the TOF-SIMS technology in a multimodal molecular imaging context.

Original language	English
Pages (from-to)	2217-2228
Number of pages	12
Journal	Journal of Analytical Atomic Spectrometry
Volume	34
Issue number	11
DOIs	https://doi.org/10.1039/c9ja00164f
Publication status	Published - 1 Nov 2019

Keywords

ION MASS-SPECTROMETRY
METAL-ASSISTED SIMS
PRINCIPAL COMPONENT ANALYSIS
ADSORBED PROTEIN FILMS
CLUSTER ION
DESORPTION IONIZATION
SPATIAL-RESOLUTION
SAMPLE PREPARATION
MALDI-MS
LIPIDS

Access to Document

10.1039/c9ja00164f

Full TextFinal published version, 938 KBLicence: Taverne

Cite this

@article{51692180cacf4af497d3fbe28f43a2c9,

title = "A concise tutorial review of TOF-SIMS based molecular and cellular imaging",

abstract = "This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined with a signal enhancement method depending on the surface under investigation. The types of detected molecules and methods for molecular identification in SIMS are strongly determined by this combination of ionization method and sample preparation. The use of TOF-SIMS for single cell and three-dimensional imaging will be discussed in the context of selected applications. Finally we will discuss an outlook on the application of the TOF-SIMS technology in a multimodal molecular imaging context.",

keywords = "ION MASS-SPECTROMETRY, METAL-ASSISTED SIMS, PRINCIPAL COMPONENT ANALYSIS, ADSORBED PROTEIN FILMS, CLUSTER ION, DESORPTION IONIZATION, SPATIAL-RESOLUTION, SAMPLE PREPARATION, MALDI-MS, LIPIDS",

author = "Philippe Massonnet and Heeren, {Ron M. A.}",

note = "Funding Information: This research was conducted as part of the M4I research program which is nancially supported by the LINK program of the Dutch Province of Limburg. The authors also acknowledge the NWO-TTW UPON A3 project and the NWO-GWI NEMI (Netherlands Electron Microscopy Infrastructure) for the nancial support. Funding Information: This research was conducted as part of the M4I research program which is financially supported by the LINK program of the Dutch Province of Limburg. The authors also acknowledge the NWO-TTW UPON A3 project and the NWO-GWI NEMI (Netherlands Electron Microscopy Infrastructure) for the financial support. Publisher Copyright: {\textcopyright} 2019 The Royal Society of Chemistry.",

year = "2019",

month = nov,

day = "1",

doi = "10.1039/c9ja00164f",

language = "English",

volume = "34",

pages = "2217--2228",

journal = "Journal of Analytical Atomic Spectrometry",

issn = "0267-9477",

publisher = "Royal Society of Chemistry",

number = "11",

}

TY - JOUR

T1 - A concise tutorial review of TOF-SIMS based molecular and cellular imaging

AU - Massonnet, Philippe

AU - Heeren, Ron M. A.

N1 - Funding Information: This research was conducted as part of the M4I research program which is nancially supported by the LINK program of the Dutch Province of Limburg. The authors also acknowledge the NWO-TTW UPON A3 project and the NWO-GWI NEMI (Netherlands Electron Microscopy Infrastructure) for the nancial support. Funding Information: This research was conducted as part of the M4I research program which is financially supported by the LINK program of the Dutch Province of Limburg. The authors also acknowledge the NWO-TTW UPON A3 project and the NWO-GWI NEMI (Netherlands Electron Microscopy Infrastructure) for the financial support. Publisher Copyright: © 2019 The Royal Society of Chemistry.

PY - 2019/11/1

Y1 - 2019/11/1

N2 - This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined with a signal enhancement method depending on the surface under investigation. The types of detected molecules and methods for molecular identification in SIMS are strongly determined by this combination of ionization method and sample preparation. The use of TOF-SIMS for single cell and three-dimensional imaging will be discussed in the context of selected applications. Finally we will discuss an outlook on the application of the TOF-SIMS technology in a multimodal molecular imaging context.

AB - This concise tutorial review provides a description of the current state of the art in the application of time-of flight based secondary ion mass spectrometry (TOF-SIMS) in the field of molecular and cellular imaging. The application of TOF-SIMS requires a choice of the appropriate beam combined with a signal enhancement method depending on the surface under investigation. The types of detected molecules and methods for molecular identification in SIMS are strongly determined by this combination of ionization method and sample preparation. The use of TOF-SIMS for single cell and three-dimensional imaging will be discussed in the context of selected applications. Finally we will discuss an outlook on the application of the TOF-SIMS technology in a multimodal molecular imaging context.

KW - ION MASS-SPECTROMETRY

KW - METAL-ASSISTED SIMS

KW - PRINCIPAL COMPONENT ANALYSIS

KW - ADSORBED PROTEIN FILMS

KW - CLUSTER ION

KW - DESORPTION IONIZATION

KW - SPATIAL-RESOLUTION

KW - SAMPLE PREPARATION

KW - MALDI-MS

KW - LIPIDS

U2 - 10.1039/c9ja00164f

DO - 10.1039/c9ja00164f

M3 - (Systematic) Review article

SN - 0267-9477

VL - 34

SP - 2217

EP - 2228

JO - Journal of Analytical Atomic Spectrometry

JF - Journal of Analytical Atomic Spectrometry

IS - 11

ER -